• DocumentCode
    3398448
  • Title

    Invasive PUF Analysis

  • Author

    Nedospasov, Dmitry ; Seifert, Jean-Pierre ; Helfmeier, Clemens ; Boit, Christian

  • Author_Institution
    Dept. of Software Eng. & Theor. Comput. Sci., Tech. Univ. Berlin, Berlin, Germany
  • fYear
    2013
  • fDate
    20-20 Aug. 2013
  • Firstpage
    30
  • Lastpage
    38
  • Abstract
    In this work we consider the suitability of Phyiscaly Unclonable Functions (PUFs) for high-security applications. For PUFs to be considered secure in such scenarios they must be resilient to both semi-invasive and fully-invasive attacks. We introduce a new failure analysis technique for semi-invasive, single-trace, backside readout of logic states. We apply this technique to characterize the unique physical response of a memory-based PUF. With these results we identify several weakness in current PUF schemes. We extend current PUF definitions to be resilient against such attacks by requiring that PUFs be implemented in a serialized manner. Finally, we improve already existing PUF architectures to include these concepts.
  • Keywords
    SRAM chips; failure analysis; integrated circuit reliability; integrated circuits; security of data; backside readout; failure analysis technique; fully-invasive attacks; high-security applications; invasive PUF analysis; memory-based PUF; modern secure integrated circuits; nonvolatile memory; physically unclonable functions; secure storage; semi-invasive attacks; semi-invasive readout; single-trace readout; Integrated circuits; Inverters; Lasers; Logic gates; Random access memory; Silicon; Transistors; Fully-invasive; IC security; Laser characterization; PUF; Semi-invasive; Tamper-evidence;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Fault Diagnosis and Tolerance in Cryptography (FDTC), 2013 Workshop on
  • Conference_Location
    Santa Barbara, CA
  • Print_ISBN
    978-0-7695-5059-6
  • Type

    conf

  • DOI
    10.1109/FDTC.2013.19
  • Filename
    6623553