DocumentCode
3398448
Title
Invasive PUF Analysis
Author
Nedospasov, Dmitry ; Seifert, Jean-Pierre ; Helfmeier, Clemens ; Boit, Christian
Author_Institution
Dept. of Software Eng. & Theor. Comput. Sci., Tech. Univ. Berlin, Berlin, Germany
fYear
2013
fDate
20-20 Aug. 2013
Firstpage
30
Lastpage
38
Abstract
In this work we consider the suitability of Phyiscaly Unclonable Functions (PUFs) for high-security applications. For PUFs to be considered secure in such scenarios they must be resilient to both semi-invasive and fully-invasive attacks. We introduce a new failure analysis technique for semi-invasive, single-trace, backside readout of logic states. We apply this technique to characterize the unique physical response of a memory-based PUF. With these results we identify several weakness in current PUF schemes. We extend current PUF definitions to be resilient against such attacks by requiring that PUFs be implemented in a serialized manner. Finally, we improve already existing PUF architectures to include these concepts.
Keywords
SRAM chips; failure analysis; integrated circuit reliability; integrated circuits; security of data; backside readout; failure analysis technique; fully-invasive attacks; high-security applications; invasive PUF analysis; memory-based PUF; modern secure integrated circuits; nonvolatile memory; physically unclonable functions; secure storage; semi-invasive attacks; semi-invasive readout; single-trace readout; Integrated circuits; Inverters; Lasers; Logic gates; Random access memory; Silicon; Transistors; Fully-invasive; IC security; Laser characterization; PUF; Semi-invasive; Tamper-evidence;
fLanguage
English
Publisher
ieee
Conference_Titel
Fault Diagnosis and Tolerance in Cryptography (FDTC), 2013 Workshop on
Conference_Location
Santa Barbara, CA
Print_ISBN
978-0-7695-5059-6
Type
conf
DOI
10.1109/FDTC.2013.19
Filename
6623553
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