DocumentCode
3399086
Title
Low-frequency dispersion of ZnO/Bi2 O3 ceramics analyzing by universal power law
Author
Min, Daomin ; Li, Shengtao ; Zhou, Zhangbin ; Yin, Guilai ; Li, Jianying
Author_Institution
State Key Lab. of Electr. Insulation & Power Equip., Xi´´an Jiaotong Univ., Xi´´an, China
fYear
2009
fDate
19-23 July 2009
Firstpage
345
Lastpage
348
Abstract
Recently, universal power law becomes widely used. In this paper, it was used to study the ZnO/Bi2O3 ceramics. Bi2O3 is the only additive of ZnO here in order to directly study the effect of Bi2O3 in ZnO. ZnO samples with different content of Bi2O3 were made by the traditional ceramic technique. Then the microstructure of the acid erosion surface was observed by polarized optical microscope, the dielectric properties of the samples, such as conductivity, permittivity and dielectric loss, were tested by Novocontrol Broadband-Frequency Dielectric Temperature Measuring Instrument, and the activation energy was calculated by Arrhenius relation. A strong Anomalous low-frequency dispersion phenomenon was found while investigating the dielectric properties of ZnO/Bi2O3 ceramics. The experimental results of the dielectric properties which are in the frequency range of 0.1 Hz ~ 107 Hz and the temperature range of 173 K ~ 473 K were systematically analyzed by universal power law. The results show that the conductivity loss is the main factor in the low frequency, while the dielectric loss is dominant in the high frequency. The higher the temperature, the more similarity of the AC I-V characteristic to the DC ones, which means that omegae can token the thermally simulated degree of electrons to the temperature, since the conductivity of the samples was generated mostly by thermally simulated electrons. The density ratio of zinc interstitials and oxygen vacancies decreased with the increase of Bi2O3 content fewer than 5 wt%, and then it will be oxygen vacancies from 5 wt % Bi2O3 content to 15 wt% that dominated the dielectric properties.
Keywords
ceramics; crystal microstructure; dielectric losses; dielectric materials; electrical conductivity; permittivity; Arrhenius relation; Novocontrol Broadband-Frequency Dielectric Temperature Measuring Instrument; ZnO-Bi2O3; acid erosion surface; ceramics; conductivity; density ratio; dielectric loss; dielectric properties; low-frequency dispersion; microstructure; oxygen vacancies; permittivity; polarized optical microscope; universal power law; Bismuth; Ceramics; Dielectric loss measurement; Dielectric losses; Electrons; Frequency; Optical microscopy; Temperature; Thermal conductivity; Zinc oxide; Dielectric property; Low-frequency dispersion; Universal power law; ZnO;
fLanguage
English
Publisher
ieee
Conference_Titel
Properties and Applications of Dielectric Materials, 2009. ICPADM 2009. IEEE 9th International Conference on the
Conference_Location
Harbin
Print_ISBN
978-1-4244-4367-3
Electronic_ISBN
978-1-4244-4368-0
Type
conf
DOI
10.1109/ICPADM.2009.5252414
Filename
5252414
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