• DocumentCode
    3400398
  • Title

    Research on the characteristic for the dielectric of building and the material of grounding by lightning stroke

  • Author

    Jin, Lijun ; Lu, Ganwen ; Mei, Jian ; Han, Lu ; Shen, Yuzhou

  • Author_Institution
    Dept. of Electr. Eng., Tongji Univ., Shanghai, China
  • fYear
    2009
  • fDate
    19-23 July 2009
  • Firstpage
    172
  • Lastpage
    175
  • Abstract
    How to effectively prevent the electronic equipments and information systems in building from lightning hazard is a key problem to lightning-protection. Here is a simulation model established for analyzing the electromagnetic field distribution of building, which is hit by lightning strike. The electric field intensity and voltage distribution of cement wall and soil medium are calculated by ANSYS software. The simulation results show that there are many kinds of lightning in nature. Therefore, lightning-protection measures should be based on specific structure features and characteristics of buildings´ internal device. The damage of lightning presents new characters and the damage degree of lightning induction is deeper than direct lightning strike. And the simulation results can also be a reference in the design of building lightning-protection.
  • Keywords
    building management systems; dielectric materials; earthing; electric fields; lightning protection; voltage distribution; ANSYS software; building dielectric; cement wall; electric field intensity; electromagnetic field distribution; electronic equipments; grounding; information systems; lightning hazard; lightning induction; lightning stroke; lightning- protection; soil medium; voltage distribution; Analytical models; Buildings; Dielectric materials; Electromagnetic analysis; Electromagnetic modeling; Electronic equipment; Grounding; Hazards; Information systems; Lightning; dielectric; grounding; lightning; lightning-protection for buildings;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Properties and Applications of Dielectric Materials, 2009. ICPADM 2009. IEEE 9th International Conference on the
  • Conference_Location
    Harbin
  • Print_ISBN
    978-1-4244-4367-3
  • Electronic_ISBN
    978-1-4244-4368-0
  • Type

    conf

  • DOI
    10.1109/ICPADM.2009.5252477
  • Filename
    5252477