• DocumentCode
    3400442
  • Title

    Finite element model applications in defibrillation and external cardiac pacing

  • Author

    Barnett, David W. ; Fahy, J. Ben ; Wu, Hsi-Jung ; Lytle, Alison ; Kim, Yongmin

  • Author_Institution
    Dept. of Electr. Eng., Washington Univ., Seattle, WA, USA
  • fYear
    1988
  • fDate
    4-7 Nov. 1988
  • Firstpage
    200
  • Abstract
    The authors have applied finite-element computer models to electrode design problems in defibrillation, external cardiac pacing, and electrosurgery. These models solve Laplace´s equation to determine voltage and current density distribution throughout the body and electrodes. The models are flexible (easily modified) and have proved to be an effective tool in evaluating electrodes, predicting their performance, and designing better and safer electrodes. In addition, physical modeling techniques for measuring current density profiles under the actively driven electrodes have been developed to verify computer simulation results and to test electrodes as they are constructed. The authors have used both numerical and experimental techniques in determining relative performance rankings of three types of internal defibrillation electrodes. To facilitate the widespread use of these techniques in other research and clinical applications, the authors have ported the finite-element model programs from their traditional mainframe environment to a far less expensive personal computer environment.<>
  • Keywords
    bioelectric phenomena; cardiology; finite element analysis; patient treatment; physiological models; Laplace´s equation; actively driven electrodes; current density profiles; defibrillation; electrode design problems; electrosurgery; external cardiac pacing; finite-element computer models; internal defibrillation electrodes; physical modeling techniques;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering in Medicine and Biology Society, 1988. Proceedings of the Annual International Conference of the IEEE
  • Conference_Location
    New Orleans, LA, USA
  • Print_ISBN
    0-7803-0785-2
  • Type

    conf

  • DOI
    10.1109/IEMBS.1988.94477
  • Filename
    94477