• DocumentCode
    3400713
  • Title

    Pulsed stress behavior of PEDOT:PSS thin films

  • Author

    Bonfert, D. ; Klink, G. ; Bock, K. ; Svasta, P. ; Ionescu, Clara

  • Author_Institution
    Fraunhofer Inst. Reliability & Microintegration (FhG - IZM-M), Munich, Germany
  • fYear
    2009
  • fDate
    17-20 Sept. 2009
  • Firstpage
    75
  • Lastpage
    80
  • Abstract
    There is a necessity to include sensors (resistors) in the design of organic electronic devices in order to extend the range of possible applications, mentioned in the last iNEMI roadmap. It is essential to identify potential organic resistive materials, the processes and methods to structure them and to characterize their resistive properties on flexible substrates. A material widely used in organic electronics is the intrinsically conductive polymer (ICP) poly (3, 4-ethylendioxythiophene) doped with polystyrene sulfonate acid (PEDOT:PSS). In this paper we focus on the pulsed stress behavior of this conductive polymer, normally used as a conductive layer and the resulting changes of the resistive properties.
  • Keywords
    conducting polymers; electrostatic discharge; flexible electronics; nondestructive testing; organic semiconductors; polymer films; PEDOT:PSS thin films; electrostatic discharge; intrinsically conductive polymer; organic electronics; poly (3, 4-ethylendioxythiophene); polystyrene sulfonate acid; pulsed stress behavior; Stress; Transistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design and Technology of Electronics Packages, (SIITME) 2009 15th International Symposium for
  • Conference_Location
    Gyula
  • Print_ISBN
    978-1-4244-5132-6
  • Electronic_ISBN
    978-1-4244-5133-3
  • Type

    conf

  • DOI
    10.1109/SIITME.2009.5407397
  • Filename
    5407397