Response and resistance to drugs and chemical stress in the yeast model: A genome-wide view

Author

Costa dos Santos, Sandra ; Cacho Teixeira, Miguel ; Pereira Mira, Nuno ; Rodrigues Cabrito, Tania ; Palma, Margarida ; Bastos Lourenco, Artur Bastos ; Dias, P.J. ; Guerreiro, Joao ; Moreira, Alberto ; Henriques, Susana ; Sa-Correia, Isabel

Author_Institution

IBB - Inst. for Biotechnol. & Bioeng., Inst. Super. Tecnico, Lisbon, Portugal

fYear

2011

fDate

1-4 March 2011

Firstpage

1

Lastpage

4

Abstract

In this article we provide a brief overview on the activities of the Biological Sciences Research Group (BRSG) (http://groups.ist.utl.pt/bsrg/) of the Institute for Biotechnology and Bioengineering at Instituto Superior Tecnico, involving OMICS and Molecular Systems Biology approaches applied to the understanding of mechanisms involved in the Yeast Stress Response. Genomics, chemogenomics, transcriptomics, quantitative proteomics and metabolomics are explored to get an integrative view on the response and resistance to drugs and other chemical stresses in the model eukaryote and industrial yeast species Saccharomyces cerevisiae.

Keywords

biochemistry; cellular biophysics; drugs; genomics; microorganisms; molecular biophysics; physiological models; proteomics; Biological Sciences Research Group; Institute for Biotechnology and Bioengineering; Instituto Superior Tecnico; Saccharomyces cerevisiae; chemical stress; chemical stresses; chemogenomics; drug resistance; genome-wide view; genomics; industrial yeast species; metabolomics; model eukaryote; molecular system biology approaches; proteomics; transcriptomics; yeast model; yeast stress response; Bioinformatics; Chemicals; Drugs; Genomics; Immune system; Proteomics; Stress; Saccharomyces cerevisiae; industrial systems biology; molecular systems biology; pharmacogenomics; stress resistance; toxicogenomics;

fLanguage

English

Publisher

ieee

Conference_Titel

Bioengineering (ENBENG), 2011. ENBENG 2011. 1st Portuguese Meeting in

Conference_Location

Lisbon

Print_ISBN

978-1-4577-0522-9

Electronic_ISBN

978-1-4577-0521-2

Type

conf

DOI

10.1109/ENBENG.2011.6026076

Filename

6026076