DocumentCode
3403359
Title
Robust RVM regression using sparse outlier model
Author
Mitra, Kaushik ; Veeraraghavan, Ashok ; Chellappa, Rama
Author_Institution
Dept. of Electr. & Comput. Eng., Univ. of Maryland, College Park, MD, USA
fYear
2010
fDate
13-18 June 2010
Firstpage
1887
Lastpage
1894
Abstract
Kernel regression techniques such as Relevance Vector Machine (RVM) regression, Support Vector Regression and Gaussian processes are widely used for solving many computer vision problems such as age, head pose, 3D human pose and lighting estimation. However, the presence of outliers in the training dataset makes the estimates from these regression techniques unreliable. In this paper, we propose robust versions of the RVM regression that can handle outliers in the training dataset. We decompose the noise term in the RVM formulation into a (sparse) outlier noise term and a Gaussian noise term. We then estimate the outlier noise along with the model parameters. We present two approaches for solving this estimation problem: (1) a Bayesian approach, which essentially follows the RVM framework and (2) an optimization approach based on Basis Pursuit Denoising. In the Bayesian approach, the robust RVM problem essentially becomes a bigger RVM problem with the advantage that it can be solved efficiently by a fast algorithm. Empirical evaluations, and real experiments on image de-noising and age estimation demonstrate the better performance of the robust RVM algorithms over that of the RVM reg ression.
Keywords
Gaussian noise; computer vision; image denoising; regression analysis; 3D human pose; Bayesian approach; Gaussian noise; basis pursuit denoising; computer vision; image denoising; lighting estimation; relevance vector machine; robust RVM regression; sparse outlier model; Bayesian methods; Computer vision; Gaussian noise; Gaussian processes; Humans; Image denoising; Kernel; Magnetic heads; Noise reduction; Noise robustness;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer Vision and Pattern Recognition (CVPR), 2010 IEEE Conference on
Conference_Location
San Francisco, CA
ISSN
1063-6919
Print_ISBN
978-1-4244-6984-0
Type
conf
DOI
10.1109/CVPR.2010.5539861
Filename
5539861
Link To Document