• DocumentCode
    3403359
  • Title

    Robust RVM regression using sparse outlier model

  • Author

    Mitra, Kaushik ; Veeraraghavan, Ashok ; Chellappa, Rama

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of Maryland, College Park, MD, USA
  • fYear
    2010
  • fDate
    13-18 June 2010
  • Firstpage
    1887
  • Lastpage
    1894
  • Abstract
    Kernel regression techniques such as Relevance Vector Machine (RVM) regression, Support Vector Regression and Gaussian processes are widely used for solving many computer vision problems such as age, head pose, 3D human pose and lighting estimation. However, the presence of outliers in the training dataset makes the estimates from these regression techniques unreliable. In this paper, we propose robust versions of the RVM regression that can handle outliers in the training dataset. We decompose the noise term in the RVM formulation into a (sparse) outlier noise term and a Gaussian noise term. We then estimate the outlier noise along with the model parameters. We present two approaches for solving this estimation problem: (1) a Bayesian approach, which essentially follows the RVM framework and (2) an optimization approach based on Basis Pursuit Denoising. In the Bayesian approach, the robust RVM problem essentially becomes a bigger RVM problem with the advantage that it can be solved efficiently by a fast algorithm. Empirical evaluations, and real experiments on image de-noising and age estimation demonstrate the better performance of the robust RVM algorithms over that of the RVM reg ression.
  • Keywords
    Gaussian noise; computer vision; image denoising; regression analysis; 3D human pose; Bayesian approach; Gaussian noise; basis pursuit denoising; computer vision; image denoising; lighting estimation; relevance vector machine; robust RVM regression; sparse outlier model; Bayesian methods; Computer vision; Gaussian noise; Gaussian processes; Humans; Image denoising; Kernel; Magnetic heads; Noise reduction; Noise robustness;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Vision and Pattern Recognition (CVPR), 2010 IEEE Conference on
  • Conference_Location
    San Francisco, CA
  • ISSN
    1063-6919
  • Print_ISBN
    978-1-4244-6984-0
  • Type

    conf

  • DOI
    10.1109/CVPR.2010.5539861
  • Filename
    5539861