A new static test of a DAC with a built-in structure

A new BIST (Built-In Self-Test) scheme to test static parameters of a DAC (Digital-to-Analog Converter) is proposed in this paper. The proposed BIST employs a ramp generator and two voltage references to calculate static parameters of a DAC such as offset, gain, INL (Integral Non-Linearity) and DNL(Differential Non-Linearity). The optimization of calculating static parameters and the element sharing can reduce the BIST circuitry. The simulation results which validate our method are able to detect the linearity errors with the simple hardware architecture.