DocumentCode
3405842
Title
Radiated emissions of very large scale integrated circuits
Author
Muccioli, James ; Ashley, Scott
Author_Institution
Chrysler Motors Corp., Highland Park, MI, USA
fYear
1990
fDate
21-23 Aug 1990
Firstpage
292
Lastpage
299
Abstract
EMC (electromagnetic compatibility) testing was performed on a microprocessor to examine its radiated emissions. Special software was also written to exercise different functions of the microprocessor to determine how software affects emissions. Results indicate that a microprocessor does radiate and software can have a large influence on radiated emissions
Keywords
VLSI; electromagnetic compatibility; integrated circuit testing; microprocessor chips; microprogramming; EMC testing; electromagnetic compatibility; microprocessor; radiated emissions; software; very large scale integrated circuits; Application specific integrated circuits; Circuit testing; Containers; Integrated circuit measurements; Microprocessors; Performance evaluation; Pins; Printed circuits; Silicon; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
Electromagnetic Compatibility, 1990. Symposium Record., 1990 IEEE International Symposium on
Conference_Location
Washington, DC
Print_ISBN
0-7803-7264-6
Type
conf
DOI
10.1109/ISEMC.1990.252776
Filename
252776
Link To Document