• DocumentCode
    340704
  • Title

    D0 muon proportional drift tube electronics test results

  • Author

    Baldin, B. ; Diehl, H.T. ; Haggerty, H. ; Hansen, S. ; Marshall, T. ; Zieminski, A.

  • Author_Institution
    Fermilab, Batavia, IL, USA
  • Volume
    1
  • fYear
    1998
  • fDate
    1998
  • Firstpage
    607
  • Abstract
    Test results of the proportional drift tube (PDT) electronics for the Muon Upgrade at the D0 experiment at Fermilab are described. Prototypes of two front-end boards and two readout VME modules comprising a deadtimeless readout system have been built and tested. The front-end electronics prototypes include an eight-channel front-end board and a control board. The front-end board is capable of registering PDT anode wire signals with a 1 μA threshold and two cathode pad charges at a resolution of 5 fC. Control board features include a sequencer for collecting data from up to four front-end boards, two digital signal processors (DSP), and two serial link transmitters. A serial link transports data a 100 meters from the control board to the VME based muon readout card. The muon readout card receives timing and control signals from the muon fanout card and re-transmits them to the control board. Initial tests with internal pulsers simulating detector signals and further tests with cosmic rays are described. We have tested three data taking modes. The prototype readout system transfers PDT data without deadtime at 16 mbyte/s with a level 1 trigger rate of 10 kHz
  • Keywords
    cosmic ray apparatus; cosmic ray muons; digital readout; digital signal processing chips; drift chambers; muon detection; nuclear electronics; proportional counters; 1 muA; 10 kHz; D0 muon proportional drift tube electronics; Muon Upgrade; VME based muon readout card; cathode pad charges; control board; cosmic rays; deadtimeless readout system; digital signal processors; frontend boards; internal pulsers; muon fanout card; readout VME modules; sequencer; serial link transmitters; test results; Anodes; Cathodes; Digital signal processors; Electron tubes; Electronic equipment testing; Mesons; Prototypes; Signal resolution; System testing; Wire;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium, 1998. Conference Record. 1998 IEEE
  • Conference_Location
    Toronto, Ont.
  • ISSN
    1082-3654
  • Print_ISBN
    0-7803-5021-9
  • Type

    conf

  • DOI
    10.1109/NSSMIC.1998.775214
  • Filename
    775214