• DocumentCode
    3407140
  • Title

    How To Do Weighted Random Testing For Bist?

  • Author

    Hartmann, J. ; Kemnitz, G.

  • Author_Institution
    Fachbereich Informatik, Universitat des Saarlandes, 66041 Saarbrucken Germany
  • fYear
    1993
  • fDate
    7-11 Nov. 1993
  • Firstpage
    568
  • Lastpage
    571
  • Abstract
    In this paper, a strategy as proposed whach takes into account all aspects of wezghted random testzng for BIST. Our approach arwes from results concerning the ampact of wezght roundang and a new combination of known techniques lake coupling unweighted and weighted pattern generation, basing weight calculation on a precomputed test.
  • Keywords
    Automatic test pattern generation; Benchmark testing; Built-in self-test; Circuit faults; Circuit testing; Fault detection; Hardware; Lakes; Probability; Test pattern generators;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer-Aided Design, 1993. ICCAD-93. Digest of Technical Papers., 1993 IEEE/ACM International Conference on
  • Conference_Location
    Santa Clara, CA, USA
  • Print_ISBN
    0-8186-4490-7
  • Type

    conf

  • DOI
    10.1109/ICCAD.1993.580116
  • Filename
    580116
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3407140