DocumentCode
3407417
Title
Cellular automata based synthesis of easily and fully testable FSMs
Author
Chowdhury, D.R. ; Chakraborty, S. ; Vamsi, B. ; Pal Chaudhuri, P.
Author_Institution
Dept. of Comput. Sci. & Eng., Indian Inst. of Technol., Kharagpur, India
fYear
1993
fDate
7-11 Nov. 1993
Firstpage
650
Lastpage
653
Abstract
The paper reports an application of a special class of non-group cellular automata, referred to as D1/sup */CA, as the test machine embedded in the FSM to be synthesized. The state transition properties of D1/sup */CA are exploited in designing an easy testing scheme for the finite state machine. The scheme has been found to incur a small area overhead while providing extremely high coverages close to 100% for all single stuck-at faults in the circuit.
Keywords
cellular automata; D1/sup */CA; FSM; easy testing scheme; finite state machine; fully testable FSMs; non-group cellular automata; single stuck-at faults; small area overhead; state transition properties; test machine; Application software; Automata; Automatic testing; Benchmark testing; Circuit faults; Circuit testing; Computer science; Costs; Design for testability; Sequential analysis;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer-Aided Design, 1993. ICCAD-93. Digest of Technical Papers., 1993 IEEE/ACM International Conference on
Conference_Location
Santa Clara, CA, USA
Print_ISBN
0-8186-4490-7
Type
conf
DOI
10.1109/ICCAD.1993.580155
Filename
580155
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