DocumentCode
3407432
Title
Unifying test and diagnosis of interconnects and logic clusters in partial boundary scan boards
Author
Marzouki, M. ; Lubaszewski, M. ; Touati, M.H.
Author_Institution
INPG/TIMA, Grenoble, France
fYear
1993
fDate
7-11 Nov. 1993
Firstpage
654
Lastpage
657
Abstract
A methodology is presented that unifies the fault detection and fault diagnosis of boundary scan (BS) interconnects and logic clusters in partial boundary scan boards. The software implementing this methodology and some experimental results are also described.
Keywords
boundary scan testing; BS interconnects; boundary scan; fault detection; fault diagnosis; logic clusters; partial boundary scan boards; software; Circuit faults; Circuit testing; Fault detection; Fault diagnosis; Integrated circuit interconnections; Knowledge based systems; Logic testing; Observability; System testing; Wiring;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer-Aided Design, 1993. ICCAD-93. Digest of Technical Papers., 1993 IEEE/ACM International Conference on
Conference_Location
Santa Clara, CA, USA
Print_ISBN
0-8186-4490-7
Type
conf
DOI
10.1109/ICCAD.1993.580156
Filename
580156
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