• DocumentCode
    3407448
  • Title

    Capacitors impedance measurement using ellipse fiitting algorithm with sub-nyquist samplig

  • Author

    Tlemcani, Mouhaydine ; Albino, Alvaro ; Silva, H.G. ; Bezzeghoud, Mourad

  • Author_Institution
    Evora Geophys. Centre, Univ. de Evora, Evora, Portugal
  • fYear
    2013
  • fDate
    20-23 Oct. 2013
  • Firstpage
    1030
  • Lastpage
    1031
  • Abstract
    In this work, a new approach on capacitors test and characterization is presented. The technique is based on a ammeter/voltmeter measurement setup using analog to digital converters (ADC) and an ellipse fitting signal processing algorithm. The method as shown here, is robust and allows accurate measurements in a wide range of frequency spectrum.
  • Keywords
    ammeters; analogue-digital conversion; electric impedance measurement; elliptic equations; signal processing; voltmeters; ADC; ammeter measurement; analog to digital converters; capacitors impedance measurement; ellipse fitting algorithm; ellipse fitting signal processing algorithm; subnyquist sampling; voltmeter measurement; Capacitors; Fitting; Frequency measurement; Impedance measurement; Instruments; Voltage measurement; ADC; capacitors; ellipse fitting;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Renewable Energy Research and Applications (ICRERA), 2013 International Conference on
  • Conference_Location
    Madrid
  • Type

    conf

  • DOI
    10.1109/ICRERA.2013.6749903
  • Filename
    6749903
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3407448