DocumentCode
3408172
Title
Epi replacement and up to 30% process simplification in a CMOS foundry environment using the BILLI structure
Author
Teague, Martin ; Johns, Susan ; Haase, Rob ; Jones, Paul ; Lister, Peter ; Borland, John
Author_Institution
Newport Waferfab Ltd., UK
Volume
1
fYear
1999
fDate
1999
Firstpage
63
Abstract
We report for the first time a reduction of up to 30% in front end processing steps and the potential elimination of epi wafers from a typical CMOS twin well process scheme. This was achieved through process integration and optimization of the BILLI technology while maintaining all standard device parametrics. We show our process integration methodology and device parametric tuning results as a function of BILLI implant energy, dose and species in forming the twin n-well and p-well structures. Consequently, the BILLI process has commenced implementation in manufacturing, allowing us to pass on significant benefits to our customers in reducing both cost and cycle time, and be very competitive in the foundry business
Keywords
CMOS integrated circuits; integrated circuit economics; integrated circuit manufacture; ion implantation; BILLI structure; CMOS twin well process scheme; cost reduction; cycle time; device parametric tuning; epi replacement; front end processing steps; implant dose; implant energy; process integration; process simplification; CMOS process; CMOS technology; Costs; Foundries; Geometry; Implants; Manufacturing processes; Resists; Signal processing; Stacking;
fLanguage
English
Publisher
ieee
Conference_Titel
Ion Implantation Technology Proceedings, 1998 International Conference on
Conference_Location
Kyoto
Print_ISBN
0-7803-4538-X
Type
conf
DOI
10.1109/IIT.1999.812052
Filename
812052
Link To Document