DocumentCode
3408537
Title
2001 IEEE International Workshop on Memory Technology, Design and Testing [front matter]
fYear
2001
fDate
6-7 Aug. 2001
Abstract
Conference proceedings front matter may contain various advertisements, welcome messages, committee or program information, and other miscellaneous conference information. This may in some cases also include the cover art, table of contents, copyright statements, title-page or half title-pages, blank pages, venue maps or other general information relating to the conference that was part of the original conference proceedings.
fLanguage
English
Publisher
ieee
Conference_Titel
Memory Technology, Design and Testing, IEEE International Workshop on, 2001.
Conference_Location
San Jose, CA, USA
Print_ISBN
0-7695-1242-9
Type
conf
DOI
10.1109/MTDT.2001.945220
Filename
945220
Link To Document