• DocumentCode
    3409468
  • Title

    A scalable I/O architecture for wide I/O DRAM

  • Author

    Harvard, Q. ; Baker, R. Jacob

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Boise State Univ., Boise, ID, USA
  • fYear
    2011
  • fDate
    7-10 Aug. 2011
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    A 4 Gb DRAM architecture utilizing a scalable number of data pins is proposed. The architecture does not impact chip size and does not require additional metal layers. The 4 Gb DRAM measure 68.88 mm2 and achieves an array efficiency of 59.9%. This was accomplished by using a split bank, edge I/O interface, central row, and central column structures. The architecture coincides with the chip size and array efficiency measurements predicted by the ITRS for a 40 nm 2012 production DRAM architecture.
  • Keywords
    DRAM chips; DRAM architecture; central column; central row; edge I/O interface; efficiency 59.9 percent; scalable I/O architecture; split bank; storage capacity 4 Gbit; wide I/O DRAM; Fires; Random access memory; Routing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems (MWSCAS), 2011 IEEE 54th International Midwest Symposium on
  • Conference_Location
    Seoul
  • ISSN
    1548-3746
  • Print_ISBN
    978-1-61284-856-3
  • Electronic_ISBN
    1548-3746
  • Type

    conf

  • DOI
    10.1109/MWSCAS.2011.6026682
  • Filename
    6026682