A new EDAC technique against soft errors based on pulse detectors

In this paper, a new technique is proposed in order to assure the reliability of digital circuits against single event upsets (SEUs) and multi-bit upsets (MBUs), which are a major concern in a radiation environment like space. This proposal reduces the area cost of triple modular redundancy (TMR), offering a similar protection level. In order to show the reliability and the area savings for this technique, it has been implemented using a commercial library to protect registers of different size. A software fault injection platform has been used in order to verify the reliability of the proposed technique.