DocumentCode
341277
Title
Equating laboratories: modelling and analysis
Author
Banks, David ; Eberhardt, Keith
Author_Institution
Nat. Inst. of Stand. & Technol., Gaithersburg, MD, USA
Volume
2
fYear
1999
fDate
1999
Firstpage
1099
Abstract
Efficient world trade requires that manufacturers in one country have confidence that their product will meet specifications that are verified by purchasers in another country. But these trading partners rely upon different national metrology laboratories to calibrate their equipment, and there is detectable divergence between their measurement systems. This paper describes statistical methods that enable one to use data from a network of artifact comparisons to estimate the measurement functions at each participating laboratory. These methods cannot determine which laboratory is most accurate, but do allow one to predict the value that a given laboratory would obtain on an artifact from the value measured at another laboratory in the comparison network
Keywords
Bayes methods; accreditation; calibration; laboratories; measurement systems; modelling; sampling methods; Bayesian analysis; Gibbs sampling; MENSOR program; bundles-of-lines model; calibration; conjugacy approximation; equating laboratories; frequentist analysis; measurement equivalence; measurement functions; measurement systems divergence; metrology laboratories; modelling; network of artifact comparisons; statistical methods; Calibration; Laboratories; Manufacturing; Metrology; Particle measurements; Polynomials; Software measurement; Statistical analysis; Testing; Transportation;
fLanguage
English
Publisher
ieee
Conference_Titel
Instrumentation and Measurement Technology Conference, 1999. IMTC/99. Proceedings of the 16th IEEE
Conference_Location
Venice
ISSN
1091-5281
Print_ISBN
0-7803-5276-9
Type
conf
DOI
10.1109/IMTC.1999.777028
Filename
777028
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