Statistical characterization and modeling of analog functional blocks

Author

Qu, Ming ; Styblinski, M.A.

Author_Institution

Dept. of Electr. Eng., Texas A&M Univ., College Station, TX, USA

Volume

1

fYear

1994

fDate

30 May-2 Jun 1994

Firstpage

121

Abstract

A methodology for statistical characterization and modeling of analog functional blocks, including inter-block and intra-block correlations is presented in this paper. The functional blocks are statistically characterized in the proposed model by a small number of postulated random variables. The related model parameter extraction is described. An OTA-C filter is used to demonstrate the proposed modeling method. Very good agreement with the Monte Carlo circuit analysis was obtained

Keywords

active filters; analogue integrated circuits; circuit analysis computing; circuit optimisation; integrated circuit noise; integrated circuit yield; statistical analysis; OTA-C filter; analog functional blocks; circuit simulators; inter-block correlations; intra-block correlations; model parameter extraction; postulated random variables; statistical characterization; statistical modeling; yield optimisation; Analog integrated circuits; Circuit analysis; Circuit simulation; Circuit synthesis; Filters; Gaussian distribution; Integrated circuit noise; Parameter extraction; Random variables; Semiconductor device modeling;

fLanguage

English

Publisher

ieee

Conference_Titel

Circuits and Systems, 1994. ISCAS '94., 1994 IEEE International Symposium on

Conference_Location

London

Print_ISBN

0-7803-1915-X

Type

conf

DOI

10.1109/ISCAS.1994.408770

Filename

408770