DocumentCode
3414841
Title
Predicting the SEU error rate through fault injection for a complex microprocessor
Author
Peronnard, P. ; Ecoffet, R. ; Pignol, M. ; Bellin, D. ; Velazco, R.
Author_Institution
TIMA Lab., Grenoble
fYear
2008
fDate
June 30 2008-July 2 2008
Firstpage
2288
Lastpage
2292
Abstract
This paper deals with the prediction of SEU error rate for an application running on a complex processor. Both, radiation ground testing and fault injection, were performed while the selected processor, a Power PC 7448, executed a software issued from a real space application. The predicted error rate shows that generally used strategies, based on static cross-section, significantly overestimate the application error rate.
Keywords
fault simulation; integrated circuit testing; logic design; microprocessor chips; Power PC 7448; SEU error rate; complex microprocessor; fault injection; radiation ground testing; Application software; Circuit faults; Circuit testing; Communication system control; Error analysis; Field programmable gate arrays; Microprocessors; Performance evaluation; Single event upset; Software testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Industrial Electronics, 2008. ISIE 2008. IEEE International Symposium on
Conference_Location
Cambridge
Print_ISBN
978-1-4244-1665-3
Electronic_ISBN
978-1-4244-1666-0
Type
conf
DOI
10.1109/ISIE.2008.4677290
Filename
4677290
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