• DocumentCode
    3414858
  • Title

    Learning a Mahalanobis distance metric via regularized LDA for scene recognition

  • Author

    Meng Wu ; Jun Zhou ; Jun Sun

  • Author_Institution
    Inst. of Image Commun. & Inf. Process., Shanghai Jiao Tong Univ., Shanghai, China
  • fYear
    2012
  • fDate
    Sept. 30 2012-Oct. 3 2012
  • Firstpage
    3125
  • Lastpage
    3128
  • Abstract
    Constructing a suitable distance metric for scene recognition is a very challenging task due to the huge intra-class variations. In this paper, we propose a novel framework for learning a full parameter matrix in Mahalanobis metric, where the learning process is formulated as a non-negatively constrained minimization problem in a projected space. To fully capture the structure of scenes, we first apply multiple regularized linear discriminant analysis (LDA) to form a candidate projection pool. Second, we adopt the pairwise squared differences of the projected samples as the learning instances. Finally, the diagonal selection matrix is learned through least squares with non-negative L2-norm regularization. Experiments on two datasets in scene recognition show the effectiveness and efficiency of our approach.
  • Keywords
    image recognition; learning (artificial intelligence); least squares approximations; matrix algebra; minimisation; Mahalanobis distance metric; candidate projection pool; diagonal selection matrix; full parameter matrix; intraclass variations; learning instances; least squares; multiple regularized linear discriminant analysis; nonnegative L2-norm regularization; nonnegatively constrained minimization problem; pairwise squared differences; regularized LDA; scene recognition; Accuracy; Feature extraction; Image recognition; Measurement; Principal component analysis; Training; Vectors; Mahalanobis metric; Metric learning; non-negative L2-norm regularization; regularized LDA; scene recognition;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Image Processing (ICIP), 2012 19th IEEE International Conference on
  • Conference_Location
    Orlando, FL
  • ISSN
    1522-4880
  • Print_ISBN
    978-1-4673-2534-9
  • Electronic_ISBN
    1522-4880
  • Type

    conf

  • DOI
    10.1109/ICIP.2012.6467562
  • Filename
    6467562