ESD buses for whole-chip ESD protection

Author

Ker, Ming-Dou ; Chang, Hun-Hsien ; Chen, Tung-Yang

Author_Institution

Comput. & Commun. Res. Labs., Ind. Technol. Res. Inst., Hsinchu, Taiwan

Volume

1

fYear

1999

fDate

36342

Firstpage

545

Abstract

A novel whole-chip ESD (electrostatic discharge) protection design with multiple ESD buses has been proposed to solve the ESD protection issue in the CMOS IC which has more separated power pins. The ESD current in the CMOS IC is diverted into the ESD buses, therefore the ESD current is conducted by the ESD buses away from the internal circuits and quickly discharged through the ESD protection devices. By using the ESD buses, the CMOS IC with separated power pins can be safely protected against the ESD damage which is located in the internal circuits

Keywords

CMOS integrated circuits; electrostatic discharge; integrated circuit design; protection; 0.25 micron; 0.35 micron; CMOS ICs; ESD current diversion; electrostatic discharge protection; multiple ESD buses; separated power pins; whole-chip ESD protection; Art; Bidirectional control; CMOS integrated circuits; Communication industry; Computer aided manufacturing; Diodes; Electrostatic discharge; Integrated circuit noise; Pins; Protection;

fLanguage

English

Publisher

ieee

Conference_Titel

Circuits and Systems, 1999. ISCAS '99. Proceedings of the 1999 IEEE International Symposium on

Conference_Location

Orlando, FL

Print_ISBN

0-7803-5471-0

Type

conf

DOI

10.1109/ISCAS.1999.777949

Filename

777949