DocumentCode
3415918
Title
Logistic Regression in Immunity Testing
Author
Giunta, G. ; Audone, B.
fYear
2007
fDate
9-13 July 2007
Firstpage
1
Lastpage
6
Abstract
Logistic Regression, a statistical analysis tool used for epidemiological studies, can be successfully exploited to interpret susceptibility test results with the twofold aim of understanding which are the most significant causes affecting the Device under Test (DUT) and of providing a technique to define a global figure of safety margin when many test parameters are involved. The background of Logistic Regression is briefly summarized and then a graphical interpretation of test results is provided. Finally, the experimental validation of the method is described.
Keywords
circuit testing; electromagnetic compatibility; immunity testing; regression analysis; EMC; device under test; epidemiological study; immunity testing; logistic regression; safety margin; statistical analysis tool; Back; Electromagnetic compatibility; Immune system; Immunity testing; Linear regression; Logistics; Performance evaluation; Polarization; Safety devices; Statistical analysis;
fLanguage
English
Publisher
ieee
Conference_Titel
Electromagnetic Compatibility, 2007. EMC 2007. IEEE International Symposium on
Conference_Location
Honolulu, HI
Print_ISBN
1-4244-1349-4
Electronic_ISBN
1-4244-1350-8
Type
conf
DOI
10.1109/ISEMC.2007.52
Filename
4305632
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