• DocumentCode
    3415918
  • Title

    Logistic Regression in Immunity Testing

  • Author

    Giunta, G. ; Audone, B.

  • fYear
    2007
  • fDate
    9-13 July 2007
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    Logistic Regression, a statistical analysis tool used for epidemiological studies, can be successfully exploited to interpret susceptibility test results with the twofold aim of understanding which are the most significant causes affecting the Device under Test (DUT) and of providing a technique to define a global figure of safety margin when many test parameters are involved. The background of Logistic Regression is briefly summarized and then a graphical interpretation of test results is provided. Finally, the experimental validation of the method is described.
  • Keywords
    circuit testing; electromagnetic compatibility; immunity testing; regression analysis; EMC; device under test; epidemiological study; immunity testing; logistic regression; safety margin; statistical analysis tool; Back; Electromagnetic compatibility; Immune system; Immunity testing; Linear regression; Logistics; Performance evaluation; Polarization; Safety devices; Statistical analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility, 2007. EMC 2007. IEEE International Symposium on
  • Conference_Location
    Honolulu, HI
  • Print_ISBN
    1-4244-1349-4
  • Electronic_ISBN
    1-4244-1350-8
  • Type

    conf

  • DOI
    10.1109/ISEMC.2007.52
  • Filename
    4305632