• DocumentCode
    3417178
  • Title

    Research on testing method for quiescent current of automotive electronic devices

  • Author

    Jiang Yicheng ; Zhang Bowei

  • Author_Institution
    Res. Inst. of Electron. Eng. Technol., Harbin Inst. of Technol., Harbin, China
  • fYear
    2012
  • fDate
    24-26 Aug. 2012
  • Firstpage
    817
  • Lastpage
    820
  • Abstract
    Quiescent current is a key technical parameter for automotive electronic devices. Currently there are few researches on testing method for quiescent current from domestic automobile manufacturers. With actual demand from domestic automobile manufacturers, a testing method for quiescent current of automotive electronic devices is proposed in this paper. Current data of each electronic device are acquired by voltage measurement with a measurement instrument. The testing system is established with the measurement instrument and the testing software, which is developed to cooperate with the instrument. The software can be used to acquire, decode, display and analyze the test data automatically in real time, and generate evaluation report. The testing system fulfills the requirement of quiescent current test and is proven effective in field test.
  • Keywords
    automobile industry; automotive electronics; test equipment; voltage measurement; automotive electronic devices; domestic automobile manufacturers; measurement instrument; quiescent current; testing method; testing software; testing system; voltage measurement; Automobiles; Automotive engineering; Current measurement; Instruments; Resistors; automotive electronics; data acquisition; quiescent current; testing method;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Science and Information Processing (CSIP), 2012 International Conference on
  • Conference_Location
    Xi´an, Shaanxi
  • Print_ISBN
    978-1-4673-1410-7
  • Type

    conf

  • DOI
    10.1109/CSIP.2012.6308978
  • Filename
    6308978