• DocumentCode
    3417230
  • Title

    Evaluation of die coating materials for chip-on-board technology insertion in spaceborne applications

  • Author

    Le, Binh Q. ; Nhan, Elbert ; Maurer, Richard H. ; Lew, Ark L. ; Lander, Juan R. ; Lehtonen, Seppo J. ; Darrin, M. Ann Garrison

  • Author_Institution
    Appl. Phys. Lab., Johns Hopkins Univ., Laurel, MD, USA
  • fYear
    1997
  • fDate
    2-4 Apr 1997
  • Firstpage
    142
  • Lastpage
    147
  • Abstract
    Chip-on-board (COB) packaging technology has become increasingly popular for miniaturization purposes in high-reliability applications such as spaceborne electronics. It eliminates the hermetic package weight, permits the use of conventional soldered devices on an organic substrate (MCM-L), and supports rework. These characteristics provide the much needed flexibility to support a faster, better and cheaper electronic design. Miniaturization of spaceborne hardware can lead to improvement in performance and reliability as well as to cost savings. The non-hermetic nature of COB requires a careful selection of coating materials and a well planned process to provide protection against moisture ingress and contamination from the surrounding environment. This paper presents a study that evaluates the effects of various die coating materials on bare dice and the wire bonding process. It includes temperature cycling and the bias humidity test results on die coating materials as the basis for the selection of the most suitable encapsulant material for spaceborne applications
  • Keywords
    encapsulation; humidity; integrated circuit packaging; integrated circuit reliability; lead bonding; moisture; multichip modules; space vehicle electronics; MCM-L; bare dice; bias humidity test; chip-on-board technology insertion; contamination; die coating materials; encapsulant material; high-reliability applications; moisture ingress; organic substrate; packaging technology; rework; spaceborne applications; temperature cycling; wire bonding process; Coatings; Contamination; Costs; Electronics packaging; Hardware; Lead; Moisture; Protection; Space technology; Wire;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Multichip Modules, 1997., International Conference on
  • Conference_Location
    Denver, CO
  • Print_ISBN
    0-7803-3787-5
  • Type

    conf

  • DOI
    10.1109/ICMCM.1997.581163
  • Filename
    581163