• DocumentCode
    3417745
  • Title

    Test transformation to improve compaction by statistical encoding

  • Author

    Ichihara, Hideyuki ; Kinoshita, Kozo ; Pomeranz, Irith ; Reddy, Sudhakar M.

  • Author_Institution
    Dept. of Appl. Phys., Osaka Univ., Japan
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    294
  • Lastpage
    299
  • Abstract
    In test compression/decompression schemes the objective is to achieve the highest compression without sacrificing fault coverage. In this paper, we propose a method to transform a test set in order to achieve higher compression without sacrificing fault coverage, while using statistical encoding techniques. The compression ratio of a test set depends on the entropy of the test set, and hence our test transformation method decreases the entropy of the test set without losing the fault coverage. Experimental results show that the proposed method transforms given test sets into highly compressible ones
  • Keywords
    Huffman codes; VLSI; circuit analysis computing; data compression; digital integrated circuits; encoding; entropy; integrated circuit testing; logic testing; probability; compression ratio; fault coverage; selective code; statistical encoding; test compression/decompression schemes; test set compaction; test set entropy reduction; test transformation; Compaction; Encoding; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Design, 2000. Thirteenth International Conference on
  • Conference_Location
    Calcutta
  • ISSN
    1063-9667
  • Print_ISBN
    0-7695-0487-6
  • Type

    conf

  • DOI
    10.1109/ICVD.2000.812624
  • Filename
    812624