DocumentCode
3421062
Title
A reliability-aware design methodology for Networks-on-Chip applications
Author
Elmiligi, Haytham ; Morgan, Ahmed A. ; El-Kharashi, M. Watheq ; Gebali, Fayez
Author_Institution
Dept. of Electr. & Comput. Eng., Univ. of Victoria, Victoria, BC
fYear
2009
fDate
6-9 April 2009
Firstpage
107
Lastpage
112
Abstract
Network reliability is a key design issue that impacts the performance of all Networks-on-Chip-based systems. In this paper, we develop two reliability models for on-chip interconnection networks using both deterministic and probabilistic measures. Graph-theoretic concepts are adopted with modifications to obtain application-specific reliability models for nine regular network topologies. Using these models, a new methodology is proposed to improve the network reliability of any target application using a topology-based design approach. To validate the effectiveness of the proposed methodology, a case study was performed using an MPEG4 video application. The results were promising and proved that the proposed methodology helps designers better evaluate the impact of their network architecture on the system reliability and assists them in choosing the most appropriate architecture for a target application at early design phases.
Keywords
integrated circuit design; integrated circuit reliability; multiprocessor interconnection networks; network-on-chip; probability; MPEG4 video application; deterministic reliability models; graph-theoretic concepts; network reliability; networks-on-chip applications; on-chip interconnection networks; probabilistic reliability models; reliability-aware design methodology; Computer network reliability; Computer networks; Design engineering; Design methodology; Multiprocessor interconnection networks; Network topology; Network-on-a-chip; Redundancy; Reliability engineering; Systems engineering and theory;
fLanguage
English
Publisher
ieee
Conference_Titel
Design & Technology of Integrated Systems in Nanoscal Era, 2009. DTIS '09. 4th International Conference on
Conference_Location
Cairo
Print_ISBN
978-1-4244-4320-8
Electronic_ISBN
978-1-4244-4321-5
Type
conf
DOI
10.1109/DTIS.2009.4938035
Filename
4938035
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