• DocumentCode
    3422733
  • Title

    High wiring density Cu-polyimide thin film multilayer circuit which is realized by the vertical plated small via

  • Author

    Matsushima, Naoki ; Yamazaki, Tetsuya ; Sotokawa, Hideo ; Kojima, Hiroyuki ; Shigi, Hidetaka

  • Author_Institution
    Production Eng. Res. Lab., Hitachi Ltd., Yokohama, Japan
  • fYear
    1995
  • fDate
    4-6 Dec 1995
  • Firstpage
    97
  • Lastpage
    100
  • Abstract
    A fabrication process for Cu-polyimide thin film multilayer circuit has been developed for advanced multichip module. The multilayer circuit realizes a high wiring density circuit by applying Cu studs which are deposited by electroplating using the guide patterns made of thick positive photoresist, photosensitive polyimide for insulating layers which has low reactivity against Cu, and a polishing process for planarizing dielectric layers. This paper reports on the structure of the circuit and on the thin film process technology
  • Keywords
    copper; electroplating; multichip modules; polymer films; thin film circuits; Cu; Cu-polyimide thin film multilayer circuit; dielectric layer; electroplated stud; fabrication; insulating layer; multichip module; photoresist; planarization; polishing; vertical plated small via; wiring density; Chromium; Circuit testing; Dielectric thin films; Fabrication; High performance computing; Nonhomogeneous media; Polyimides; Resists; Thin film circuits; Wiring;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Manufacturing Technology Symposium, 1995, Proceedings of 1995 Japan International, 18th IEEE/CPMT International
  • Conference_Location
    Omiya
  • Print_ISBN
    0-7803-3622-4
  • Type

    conf

  • DOI
    10.1109/IEMT.1995.541002
  • Filename
    541002