• DocumentCode
    3425015
  • Title

    Ten years of thermal analysis at EuroSimE - What´s next?

  • Author

    Rodgers, Peter ; Eveloy, Valérie

  • Author_Institution
    Dept. of Mech. Eng., Pet. Inst., Abu Dhabi
  • fYear
    2009
  • fDate
    26-29 April 2009
  • Firstpage
    1
  • Lastpage
    12
  • Abstract
    This paper presents an overview of thermal analyses of micro-electronics and micro-systems presented in the thermal analysis Track at EuroSimE since the inception of the conference in 2000. This overview is based on a bibliography of approximately 140 papers compiled in this paper. The achievements of the conference in producing an archival record in the field of micro-electronics and micro-systems thermal analysis are summarized, in terms of numerical analysis versus experimental characterization, coupling of thermal analyses with other physics, thermal management strategies, microelectronics packaging technologies, and sustainability of thermal designs. How this work has served as a building block for thermo-mechanical and multi-physics analyses presented at the conference is outlined. Finally, critical areas of thermal analysis that need to be addressed by EuroSimE in the foreseeable future are identified.
  • Keywords
    integrated circuit packaging; numerical analysis; thermal analysis; thermal management (packaging); management strategies; microelectronics packaging technologies; microsystems thermal analysis; multiphysics analyses; numerical analysis; thermal analysis; thermo-mechanical analyses; Computational fluid dynamics; Heat transfer; Microelectronics; Physics; Process design; Technology management; Thermal conductivity; Thermal engineering; Thermal management; Thermomechanical processes;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Thermal, Mechanical and Multi-Physics simulation and Experiments in Microelectronics and Microsystems, 2009. EuroSimE 2009. 10th International Conference on
  • Conference_Location
    Delft
  • Print_ISBN
    978-1-4244-4160-0
  • Electronic_ISBN
    978-1-4244-4161-7
  • Type

    conf

  • DOI
    10.1109/ESIME.2009.4938509
  • Filename
    4938509