• DocumentCode
    3428704
  • Title

    Simulation of three-dimensional etch profile of silicon during orientation dependent anisotropic etching

  • Author

    Koide, Akira ; Tanaka, Shinji

  • Author_Institution
    Mech. Eng. Res. Lab., Hitachi Ltd., Ibaraki, Japan
  • fYear
    1997
  • fDate
    26-30 Jan 1997
  • Firstpage
    418
  • Lastpage
    423
  • Abstract
    A simulation program of a three-dimensional anisotropic etching profile is developed to design the fabrication processes of microstructures made of single crystal silicon. We can now predict a change in the shape of a silicon wafer having an arbitrary crystallographic orientation and an initial three dimensional shape including concave and convex edges. Contrary to the conventional method, which assumes that etch profiles are composed of limited crystallographic planes, the developed system makes it possible to use a number of different crystallographic planes. Using this system, we have developed two new processes for fabricating a three-dimensional microstructure. We called them a multi-step anisotropic etching process and a separated anisotropic etching process. This simulation system is a powerful tool for designing the new processes in fabricating three-dimensional microstructures
  • Keywords
    digital simulation; electronic engineering computing; elemental semiconductors; etching; micromechanical devices; physics computing; silicon; simulation; Si; crystallographic planes; fabrication; microstructures; multi-step anisotropic etching; orientation dependent anisotropic etching; separated anisotropic etching; three-dimensional etch profile; Anisotropic magnetoresistance; Chemical sensors; Crystal microstructure; Crystallography; Databases; Etching; Mechanical variables measurement; Process design; Shape; Silicon;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Micro Electro Mechanical Systems, 1997. MEMS '97, Proceedings, IEEE., Tenth Annual International Workshop on
  • Conference_Location
    Nagoya
  • ISSN
    1084-6999
  • Print_ISBN
    0-7803-3744-1
  • Type

    conf

  • DOI
    10.1109/MEMSYS.1997.581879
  • Filename
    581879