DocumentCode
3428704
Title
Simulation of three-dimensional etch profile of silicon during orientation dependent anisotropic etching
Author
Koide, Akira ; Tanaka, Shinji
Author_Institution
Mech. Eng. Res. Lab., Hitachi Ltd., Ibaraki, Japan
fYear
1997
fDate
26-30 Jan 1997
Firstpage
418
Lastpage
423
Abstract
A simulation program of a three-dimensional anisotropic etching profile is developed to design the fabrication processes of microstructures made of single crystal silicon. We can now predict a change in the shape of a silicon wafer having an arbitrary crystallographic orientation and an initial three dimensional shape including concave and convex edges. Contrary to the conventional method, which assumes that etch profiles are composed of limited crystallographic planes, the developed system makes it possible to use a number of different crystallographic planes. Using this system, we have developed two new processes for fabricating a three-dimensional microstructure. We called them a multi-step anisotropic etching process and a separated anisotropic etching process. This simulation system is a powerful tool for designing the new processes in fabricating three-dimensional microstructures
Keywords
digital simulation; electronic engineering computing; elemental semiconductors; etching; micromechanical devices; physics computing; silicon; simulation; Si; crystallographic planes; fabrication; microstructures; multi-step anisotropic etching; orientation dependent anisotropic etching; separated anisotropic etching; three-dimensional etch profile; Anisotropic magnetoresistance; Chemical sensors; Crystal microstructure; Crystallography; Databases; Etching; Mechanical variables measurement; Process design; Shape; Silicon;
fLanguage
English
Publisher
ieee
Conference_Titel
Micro Electro Mechanical Systems, 1997. MEMS '97, Proceedings, IEEE., Tenth Annual International Workshop on
Conference_Location
Nagoya
ISSN
1084-6999
Print_ISBN
0-7803-3744-1
Type
conf
DOI
10.1109/MEMSYS.1997.581879
Filename
581879
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