DocumentCode
3430371
Title
Dielectric properties of DLC films in sensor applications
Author
Guzdek, T. ; Szmidt, J. ; Clapa, M. ; Mitura, S.
Author_Institution
Inst. ofMaterials Sci. & Eng., Tech. Univ. Lodz, Poland
fYear
2001
fDate
26-30 June 2001
Firstpage
191
Lastpage
192
Abstract
Summary form only given. The market for biocompatibility materials and structures is growing steadily. Among these materials there are carbon layers, especially nanocrystalline (NCD) and diamond like carbon (DLQ) layers that are being increasingly investigated. These layers can act as biocompatible coatings as well as sensitive organic polar compounds. The layers under study were obtained on silicon substrate through low pressure plasma CVD methods. The layers were defined with the use of C-V and I-V characteristics. AFM and SEM methods were used to study the layer structure. An ellipsometric study was also conducted. This research allowed the authors to ascertain the fact that DLC and NDC layers act as dielectrics while their properties are very much dependent on the state of the layer-metal contacts. The impact of the environment for Al electrodes on the electrophysical parameters of DLC and NDC layers was also examined.
Keywords
atomic force microscopy; carbon; dielectric thin films; nanostructured materials; plasma CVD; scanning electron microscopy; AFM; C; C-V characteristics; I-V characteristics; SEM; capacitors; dielectric layers; low pressure plasma CVD; nanocrystalline layers; Biological materials; Biosensors; Capacitance-voltage characteristics; Coatings; Diamond-like carbon; Dielectric materials; Organic materials; Plasma materials processing; Plasma properties; Silicon;
fLanguage
English
Publisher
ieee
Conference_Titel
Wide Bandgap Layers, 2001. Abstract Book. 3rd International Conference on Novel Applications of
Conference_Location
Zakopane, Poland
Print_ISBN
0-7803-7136-4
Type
conf
DOI
10.1109/WBL.2001.946601
Filename
946601
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