DocumentCode

3430678

Title

Demodulation based testing of off-chip driver performance

Author

Daehn, Wilfried

Author_Institution

Hochschule Magdeburg-Stendahl

fYear

2001

fDate

2001

Firstpage

42

Lastpage

47

Keywords

Automatic testing; Circuit testing; Costs; Delay effects; Demodulation; Integrated circuit testing; Signal analysis; Signal generators; Time measurement; Timing;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Workshop, 2001. IEEE European

ISSN

1530-1877

Print_ISBN

0-7695-1017-5

Type

conf

DOI

10.1109/ETW.2001.946660

Filename

946660