• DocumentCode
    3432834
  • Title

    Improved backoff algorithm for IEEE 802.15.4 wireless sensor networks

  • Author

    Khan, Bilal Muhammad ; Ali, Falah H. ; Stipidis, Elias

  • Author_Institution
    Commun. Res. Group, Univ. of Sussex, Falmer, UK
  • fYear
    2010
  • fDate
    20-22 Oct. 2010
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    In wireless sensor networks (WSN) the medium access control CSMA/CA uses binary exponential backoff (BEB) algorithm to minimize collision among the contending nodes. The range of backoff exponent is limited to very small values. This causes channel access collision among the nodes resulting in degradation of quality of service. In this paper improved binary exponential backoff (IBEB) algorithm is proposed using interim backoff (IB) and unit interim period (IP) to minimize channel access collision by randomly waking up within the backoff time to sense the channel. The result shows that IBEB outperforms significantly the existing BEB algorithm employed in the IEEE 802.15.4 MAC standard as well as Linear/Multiplicative Increase and Linear Decrease (LMILD) and Multiplicative Increase Linear Decrease (MILD) schemes on variable network load and size.
  • Keywords
    carrier sense multiple access; quality of service; telecommunication congestion control; wireless channels; wireless sensor networks; BEB algorithm; CSMA; IEEE 802.15.4 MAC standard; IEEE 802.15.4 wireless sensor network; backoff algorithm; binary exponential backoff; channel access collision; interim backoff; linear/multiplicative increase and linear decrease; medium access control; network load; network size; quality of service; unit interim period; Algorithm design and analysis; Bandwidth; Delay; IP networks; Multiaccess communication; Quality of service; Wireless sensor networks; Binary Exponential Backoff; CSMA/CA; MAC; WSN;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Wireless Days (WD), 2010 IFIP
  • Conference_Location
    Venice
  • ISSN
    2156-9711
  • Print_ISBN
    978-1-4244-9230-5
  • Electronic_ISBN
    2156-9711
  • Type

    conf

  • DOI
    10.1109/WD.2010.5657714
  • Filename
    5657714