DocumentCode
3433003
Title
A test circuit for measuring MOSFET threshold voltage mismatch
Author
Terada, Kazuo ; Eimitsu, Masatomo
Author_Institution
Fac. of Inf. Sci., Hiroshima City Univ., Japan
fYear
2003
fDate
17-20 March 2003
Firstpage
227
Lastpage
231
Abstract
A new test circuit is proposed for evaluating MOSFET threshold voltage mismatch. This test circuit consists of many parallel-connected unit cells, in which two MOSFETs are serially-connected with each other and the node between them is connected to common wiring through a switch. The threshold voltage mismatch for the two MOSFETs is derived from the DC currents flowing through this test circuit. Experimental results confirm the merit of this test circuit.
Keywords
CMOS integrated circuits; MOSFET; electric current; integrated circuit testing; semiconductor device measurement; voltage measurement; DC currents; MOSFET threshold voltage mismatch measurement; common wiring switch; parallel-connected unit cells; serially-connected MOSFET pair; test circuit; Circuit testing; Intrusion detection; Large scale integration; MOSFET circuits; Switches; Switching circuits; Threshold voltage; Virtual manufacturing; Voltage measurement; Wiring;
fLanguage
English
Publisher
ieee
Conference_Titel
Microelectronic Test Structures, 2003. International Conference on
Print_ISBN
0-7803-7653-6
Type
conf
DOI
10.1109/ICMTS.2003.1197466
Filename
1197466
Link To Document