DocumentCode
3434824
Title
Memory-based reasoning implemented by wafer scale integration
Author
Yasunaga, Moritoshi ; Kitano, Hiroaki
Author_Institution
Hitachi Ltd., Tokyo, Japan
fYear
1993
fDate
1993
Firstpage
11
Lastpage
19
Abstract
The high robustness of memory-based reasoning (MBR), which is suitable for hardware implementation using wafer scale integration (WSI) technology, is demonstrated. A WSI MBR hardware design is proposed. Its robustness is evaluated by a WSI MBR simulator. The results show that defects or other fluctuations of device parameters have only minor impacts on the performances of the MBR. It is found that in order to obtain higher reasoning accuracy, the size of the MBR database is much more crucial than the computation resolution. The proposed WSI MBR processor takes advantage of benefits discovered in the simulation results.
Keywords
VLSI; inference mechanisms; parallel machines; MBR database; WSI MBR hardware design; device parameters; memory-based reasoning; robustness; wafer scale integration; Circuit simulation; Computational modeling; Databases; Fluctuations; Hardware; Integrated circuit technology; Laboratories; Noise robustness; Silicon; Wafer scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
Wafer Scale Integration, 1993. Proceedings., Fifth Annual IEEE International Conference on
Conference_Location
San Francisco, CA, USA
Print_ISBN
0-7803-0867-0
Type
conf
DOI
10.1109/ICWSI.1993.255278
Filename
255278
Link To Document