• DocumentCode
    3434824
  • Title

    Memory-based reasoning implemented by wafer scale integration

  • Author

    Yasunaga, Moritoshi ; Kitano, Hiroaki

  • Author_Institution
    Hitachi Ltd., Tokyo, Japan
  • fYear
    1993
  • fDate
    1993
  • Firstpage
    11
  • Lastpage
    19
  • Abstract
    The high robustness of memory-based reasoning (MBR), which is suitable for hardware implementation using wafer scale integration (WSI) technology, is demonstrated. A WSI MBR hardware design is proposed. Its robustness is evaluated by a WSI MBR simulator. The results show that defects or other fluctuations of device parameters have only minor impacts on the performances of the MBR. It is found that in order to obtain higher reasoning accuracy, the size of the MBR database is much more crucial than the computation resolution. The proposed WSI MBR processor takes advantage of benefits discovered in the simulation results.
  • Keywords
    VLSI; inference mechanisms; parallel machines; MBR database; WSI MBR hardware design; device parameters; memory-based reasoning; robustness; wafer scale integration; Circuit simulation; Computational modeling; Databases; Fluctuations; Hardware; Integrated circuit technology; Laboratories; Noise robustness; Silicon; Wafer scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Wafer Scale Integration, 1993. Proceedings., Fifth Annual IEEE International Conference on
  • Conference_Location
    San Francisco, CA, USA
  • Print_ISBN
    0-7803-0867-0
  • Type

    conf

  • DOI
    10.1109/ICWSI.1993.255278
  • Filename
    255278