A fault diagnosis methodology for the UltraSPARCTM-I microprocessor

In this paper we study the use of precomputed fault dictionaries to diagnose stuck-at and bridging defects in the UltraSPARC^TM-I processor. In constructing the dictionary we analyze the effect of the dictionary format on parameters such as memory size, computational effort, and diagnostic resolution. The dictionary is built based on modeled stuck-at faults. However to effectively diagnose both stuck-at and bridging faults, we employ a novel procedure that combines dictionary information with potential bridge defects extracted from layout. Experiments with failing devices show excellent correlation of predicted errors with actual defects