• DocumentCode
    3436599
  • Title

    RELSPEC: A Framework for Early Reliability Refinement of Embedded Applications

  • Author

    Ghosh, S.K. ; Hazra, A. ; Dey, S.

  • Author_Institution
    Dept. of Comput. Sci. & Eng., Indian Inst. of Technol., Kharagpur, Kharagpur, India
  • fYear
    2015
  • fDate
    3-7 Jan. 2015
  • Firstpage
    41
  • Lastpage
    46
  • Abstract
    The increasing complexity of safety-critical embedded applications have made it imperative to specify and analyze reliability upfront in the design flow so that reliable systems can be automatically synthesized adhering to such descriptions. This paper develops a framework, RELSPEC, to express the reliability of a safety-critical embedded application at an early-stage of the design flow and enables the reliability analysis leveraging automatically constructed intermediate probabilistic models of the system. Further, our analysis provides a mechanized way to refine the reliability in order to meet a target reliability value of the overall system. Experiments over few automotive case-studies show the efficacy of this methodology.
  • Keywords
    automotive engineering; embedded systems; probability; safety-critical software; software reliability; RELSPEC; automatically constructed intermediate probabilistic models; automotive case-studies; design flow; early reliability refinement; safety-critical embedded application; Analytical models; Computational modeling; Markov processes; Probabilistic logic; Reliability engineering; Standards; Embedded Systems; Reliability; Specification;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Design (VLSID), 2015 28th International Conference on
  • Conference_Location
    Bangalore
  • ISSN
    1063-9667
  • Type

    conf

  • DOI
    10.1109/VLSID.2015.12
  • Filename
    7031705