DocumentCode
3437254
Title
Interconnection delay in very high-speed VLSI
Author
Zhou, D. ; Preparata, F.P. ; Kang, S.M.
Author_Institution
Dept. of Electr. & Comput. Eng., Illinois Univ., Urbana, IL, USA
fYear
1988
fDate
3-5 Oct 1988
Firstpage
52
Lastpage
55
Abstract
Interconnection delay of VLSI has been a major bottleneck in the design of high-speed digital systems. The authors present a rigorous analysis of the signal propagation delay in VLSI circuits. They show that wire inductance is an important factor in determining the delay when the delay is in the subnanosecond range and that this delay cannot be well estimated by the conventional modeling of the interconnection by RC circuits. The effect of feature size scaling on circuit performance is also evaluated, and the inherent limitations on scaling due to interconnection delay is discussed. Finally, the relationship between the delay and the technology parameters, such as wire resistance, wire capacitance, wire inductance, wire width, wire length, and load capacitance is investigated to provide guidelines for the interconnection technology development
Keywords
VLSI; delays; digital integrated circuits; RC circuits; VLSI circuits; circuit performance; feature size scaling; high-speed digital systems; important factor; interconnection delay; interconnection technology; load capacitance; signal propagation delay; subnanosecond range; technology parameters; very high-speed VLSI; wire capacitance; wire inductance; wire length; wire resistance; wire width; Capacitance; Circuit optimization; Delay estimation; Digital systems; Inductance; Integrated circuit interconnections; Propagation delay; Signal analysis; Very large scale integration; Wire;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer Design: VLSI in Computers and Processors, 1988. ICCD '88., Proceedings of the 1988 IEEE International Conference on
Conference_Location
Rye Brook, NY
Print_ISBN
0-8186-0872-2
Type
conf
DOI
10.1109/ICCD.1988.25658
Filename
25658
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