• DocumentCode
    3438078
  • Title

    EO3: tester for emerging electro-optical systems

  • Author

    Highland, Ronald ; Albright, Dan ; Pudlo, Dave ; Robinson, Thomas, Jr. ; Hobbs, James

  • Author_Institution
    Northrop Grumman Corp., Rolling Meadows, IL
  • fYear
    2005
  • fDate
    26-29 Sept. 2005
  • Firstpage
    223
  • Lastpage
    229
  • Abstract
    This paper provides a detailed explanation of new test capabilities developed for and deployed in the Navy CASS (Consolidated Automated Support System) station. The EO3 system is the third generation EOSS (Electro-Optical Sub-System). The second generation EOSS is currently deployed in the Navy CASS and Army IFTE (Integrated Family of Test Equipment) stations. The EO3 performance supports testing middle wave and long wave FLIRs (Forward Looking InfraRed), SWIR (Short Wave InfraRed) cameras, visible cameras, range gated cameras, laser rangefinders, laser designators, laser spot trackers, continuous wave lasers, multi-laser coboresights, and supporting gimbal/tracking systems. Novel techniques are employed to address extremely accurate sensor to laser boresighting in a vibrational environment, 2-dimensional modulation transfer function testing, and multiple laser boresight measurements
  • Keywords
    automatic test equipment; cameras; electro-optical devices; EO3 tester; EOSS; FLIR; IFTE; Navy CASS; SWIR; consolidated automated support system; continuous wave laser; electro-optical system; forward looking infrared camera; laser designators; laser rangefinders; laser spot tracker; modulation transfer function testing; multi-laser coboresight; multiple laser boresight measurement; range gated camera; short wave infrared camera; supporting gimbal/tracking system; visible camera; Automatic testing; Cameras; Laser feedback; Lasers and electrooptics; Optical design; Production facilities; Pulse measurements; System testing; Target tracking; Vibration measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Autotestcon, 2005. IEEE
  • Conference_Location
    Orlando, FL
  • Print_ISBN
    0-7803-9101-2
  • Type

    conf

  • DOI
    10.1109/AUTEST.2005.1609133
  • Filename
    1609133