DocumentCode
3438233
Title
Critic: a knowledge-based program for critiquing circuit designs
Author
Spickelmier, Rick L. ; Newton, A. Richard
Author_Institution
Electron. Res. Lab., California Univ., Berkeley, CA, USA
fYear
1988
fDate
3-5 Oct 1988
Firstpage
324
Lastpage
327
Abstract
Critic is a knowledge-based system that looks for errors or `bad design style´ in circuit designs. Critic takes as input a description of a circuit and a knowledge-base that describes a particular design-style and technology. The knowledge base consists of: process and design-style constants, a set of primitive descriptions, a set of structure descriptions, and error-checking rules. Critic uses the information in the knowledge base to find structures and errors in the circuit. The errors can range from easily recognizable errors such as a transistor bulk being connected to the wrong supply or a static gate having nonequal rise and fall times to hard-to-recognize errors, such as those dealing with charge sharing, timing, and testability. Critic is integrated with the Berkeley CAD system, has an interactive graphical input and feedback, is easy to use, and has a firm separation between the knowledge-base and program internals
Keywords
circuit CAD; knowledge based systems; programming environments; software tools; Berkeley CAD system; Critic; charge sharing; design-style constants; error-checking rules; knowledge-based program; knowledge-based system; structure descriptions; testability; timing; Capacitance; Circuit synthesis; Circuit testing; Clocks; Graphics; Knowledge based systems; Laboratories; Process design; RLC circuits; Timing;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer Design: VLSI in Computers and Processors, 1988. ICCD '88., Proceedings of the 1988 IEEE International Conference on
Conference_Location
Rye Brook, NY
Print_ISBN
0-8186-0872-2
Type
conf
DOI
10.1109/ICCD.1988.25715
Filename
25715
Link To Document