Methods and tools for characterisation of semiconductor device models

Author

Konczykowska, Agnieszka ; Zuberek, Wlodek M.

Author_Institution

France Telecom, CNET, Bagneux, France

Volume

3

fYear

1998

fDate

1998

Firstpage

85

Abstract

Rapid developments in semiconductor technologies create new needs for devices characterisation and modelling methods. In this paper we present a characterisation and modelling methodology which provides accurate device models for computer-aided design and necessary feedback for technology process analysis. Predictive modelling tools and different extraction approaches are presented. The impact of symbolic simulation on the extraction methods is discussed

Keywords

digital simulation; electronic engineering computing; semiconductor device models; symbol manipulation; CAD; computer-aided design; model characterisation; modelling methods; parameter extraction approaches; predictive modelling tools; semiconductor device models; symbolic simulation; technology process analysis; CMOS technology; Circuit simulation; Circuit synthesis; Computational modeling; Data mining; Design automation; Heterojunction bipolar transistors; Integrated circuit interconnections; Predictive models; Semiconductor device modeling;

fLanguage

English

Publisher

ieee

Conference_Titel

Electronics, Circuits and Systems, 1998 IEEE International Conference on

Conference_Location

Lisboa

Print_ISBN

0-7803-5008-1

Type

conf

DOI

10.1109/ICECS.1998.813941

Filename

813941