• DocumentCode
    3440964
  • Title

    Some thoughts on the word error rate measurement of A/D converters

  • Author

    Chiorboli, Giovanni ; De Salvo, Barbara ; Franco, Giovanni ; Morandi, Carlo

  • Author_Institution
    Dipt. di Ingegneria dell´´Inf., Parma Univ., Italy
  • Volume
    3
  • fYear
    1998
  • fDate
    1998
  • Firstpage
    453
  • Abstract
    The word error rate (WER) of an A/D converter quantifies the probability that a wrong output code occurs because of metastability, intrinsic noise or aperture uncertainty. It can be measured in real-time, as it is customary for very low WER converters, or by post processing, when the WER is more relevant. In the paper the possible causes of inaccuracy are analyzed. First, the existing methods are reviewed, then the errors which may arise from the conventional analysis of experimental data are discussed, and it is shown that these errors can be removed in the case of post processing. Finally, the requirements on the test bench noise are discussed in connection with the qualified error level (i.e. 1, 2, 4, .., 16 LSB) and with the expected error rate
  • Keywords
    analogue-digital conversion; circuit noise; circuit testing; electric variables measurement; measurement errors; phase noise; probability; A/D converters; ADC; aperture uncertainty; intrinsic noise; metastability; post processing; probability; qualified error level; test bench noise; word error rate measurement; Apertures; Clocks; Data analysis; Error analysis; Metastasis; Noise level; Phase noise; Sampling methods; Semiconductor device noise; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics, Circuits and Systems, 1998 IEEE International Conference on
  • Conference_Location
    Lisboa
  • Print_ISBN
    0-7803-5008-1
  • Type

    conf

  • DOI
    10.1109/ICECS.1998.814034
  • Filename
    814034