DocumentCode
3440964
Title
Some thoughts on the word error rate measurement of A/D converters
Author
Chiorboli, Giovanni ; De Salvo, Barbara ; Franco, Giovanni ; Morandi, Carlo
Author_Institution
Dipt. di Ingegneria dell´´Inf., Parma Univ., Italy
Volume
3
fYear
1998
fDate
1998
Firstpage
453
Abstract
The word error rate (WER) of an A/D converter quantifies the probability that a wrong output code occurs because of metastability, intrinsic noise or aperture uncertainty. It can be measured in real-time, as it is customary for very low WER converters, or by post processing, when the WER is more relevant. In the paper the possible causes of inaccuracy are analyzed. First, the existing methods are reviewed, then the errors which may arise from the conventional analysis of experimental data are discussed, and it is shown that these errors can be removed in the case of post processing. Finally, the requirements on the test bench noise are discussed in connection with the qualified error level (i.e. 1, 2, 4, .., 16 LSB) and with the expected error rate
Keywords
analogue-digital conversion; circuit noise; circuit testing; electric variables measurement; measurement errors; phase noise; probability; A/D converters; ADC; aperture uncertainty; intrinsic noise; metastability; post processing; probability; qualified error level; test bench noise; word error rate measurement; Apertures; Clocks; Data analysis; Error analysis; Metastasis; Noise level; Phase noise; Sampling methods; Semiconductor device noise; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronics, Circuits and Systems, 1998 IEEE International Conference on
Conference_Location
Lisboa
Print_ISBN
0-7803-5008-1
Type
conf
DOI
10.1109/ICECS.1998.814034
Filename
814034
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