A universal smart control IC for high-power IGBT applications

Author

Herzer, R. ; Schimanek, E. ; Bokeloh, Ch ; Lehmann, J.

Author_Institution

SEMIKRON Elektronik GmbH, Nurnberg, Germany

Volume

3

fYear

1998

fDate

1998

Firstpage

467

Abstract

Increasing electrical requirements to more reliable and sophisticated driver technology to turn on and turn off IGBT or MOSFET power semiconductors, a new universal smart control integrated circuit (IC) for IGBT-Intelligent Power Modules (IPM) is presented. It is usable for high-power applications up to 3,500 V for several hundred amperes and frequencies up to 50 kHz. The concept includes several driver, protection and monitor functions, such as a short pulse suppression, a mutual interlock of IGBTs, an undervoltage monitoring of the operating voltage, an optional V_CE-temperature- and current-monitoring of the IGBT and a common error processing. The potential separation and the specific gate driver stages are separated. The IC is designed and manufactured in a high voltage CMOS technology. This paper comprises a detailed discussion of customers advantages due to the implementation of the SKIC2001 in terms of reliability, flexibility of control and increasing performance when paralleling high power modules

Keywords

CMOS integrated circuits; bridge circuits; driver circuits; insulated gate bipolar transistors; intelligent control; mixed analogue-digital integrated circuits; monitoring; power integrated circuits; power transistors; protection; 3500 V; 50 kHz; ASIC; HV CMOS technology; IGBT-intelligent power modules; SKIC2001; current-monitoring; driver technology; error processing; halfbridge configuration; high-power IGBT applications; monitor functions; mutual interlock; power semiconductors; protection functions; reliability; short pulse suppression; undervoltage monitoring; universal smart control IC; Application specific integrated circuits; CMOS technology; Driver circuits; Insulated gate bipolar transistors; Integrated circuit reliability; Integrated circuit technology; Monitoring; Multichip modules; Semiconductor device reliability; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Electronics, Circuits and Systems, 1998 IEEE International Conference on

Conference_Location

Lisboa

Print_ISBN

0-7803-5008-1

Type

conf

DOI

10.1109/ICECS.1998.814040

Filename

814040