• DocumentCode
    3442537
  • Title

    An Algorithm for Sensing Coverage Problem in Wireless Sensor Networks

  • Author

    Quang, Vinh Tran ; Miyoshi, Takumi

  • Author_Institution
    Grad. Sch. of Eng., Shibaura Inst. of Technol., Koto
  • fYear
    2008
  • fDate
    28-30 April 2008
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    Wireless sensor networks (WSNs) have been widely studied and usefully employed in many applications such as monitoring environment, embedded system and so on. In WSNs, substantial nodes are deployed randomly over the entire desired area; therefore, the sensing regions of different nodes may be partially overlapped. This is referred to as the sensing coverage problem. In this paper we first define a maximum sensing coverage region problem (MSCR) in WSNs and then solve the problem by the proposed algorithm. In our method, the maximum monitored area fully covered by a minimum active sensors. The main design features are: selecting a small number of delegated sensor nodes by identifying and removing redundant nodes in high-density networks and assigning them an off-duty operation while guarantees the whole area is k-covered, to make sure all events occurred in that area can be accurately and timely detected. We apply the proposed algorithm to improve LEACH, a hierarchical protocol for WSNs and develop a simulation program to evaluate the performance of the algorithm.
  • Keywords
    routing protocols; wireless sensor networks; LEACH; active sensors; hierarchical protocol; high-density networks; maximum sensing coverage problem; routing protocol; sensor nodes; wireless sensor networks; Biosensors; Chemical and biological sensors; Educational institutions; Embedded system; Intelligent sensors; Monitoring; Routing protocols; Sensor phenomena and characterization; Systems engineering and theory; Wireless sensor networks; algorithm; energy-efficiency; routing protocol; sensing coverage; wireless sensor networks;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Sarnoff Symposium, 2008 IEEE
  • Conference_Location
    Princeton, NJ
  • Print_ISBN
    978-1-4244-1843-5
  • Type

    conf

  • DOI
    10.1109/SARNOF.2008.4520056
  • Filename
    4520056