• DocumentCode
    3443231
  • Title

    A Novel Model of one-class Bearing Fault Detection using SVDD and Genetic Algorithm

  • Author

    Xin-Min, Tao ; Wan-Hai, Chen ; Du Bao-Xiang ; Yong, Xu ; Han-Guang, Dong

  • Author_Institution
    Commun. Tech. Inst. of Hrbeu, Harbin
  • fYear
    2007
  • fDate
    23-25 May 2007
  • Firstpage
    802
  • Lastpage
    807
  • Abstract
    In many bearing fault anomaly detection application, only positive (normal) samples are available for training purposes, other abnormal samples are difficult to be available. In order to solve these practical application problems, a novel model of one-class bearing fault detection based on SVDD and genetic algorithm is presented in this paper. The time domain statistics features are processed as inputs to SVDD for one-class (normal) recognition. Then SVDD is used to describe the normal data distribution characteristics with high data description ability. The SVDD is trained only with a subset of normal samples. This paper also analyzes the behavior of the classifier based on parameter selection and proposes a novel way based on genetic algorithm to determine the optimal threshold parameters. The hybrid one-class classification model of SVDD and genetic algorithm is determined to address the problem of difficultly collecting abnormal samples in bearing fault detection. Comparison of the performance of detection of SVDD with different kernel parameters is experimented. This hybrid approach is compared against other MLP detection techniques. The results show the relative effectiveness of the proposed classifiers in detection of the bearing condition with some concluding remarks.
  • Keywords
    fault diagnosis; genetic algorithms; machine bearings; multilayer perceptrons; power engineering computing; support vector machines; MLP detection; SVDD; genetic algorithm; multilayer perceptron; normal data distribution characteristics; one-class bearing fault detection; support vector data description; Fault detection; Genetic algorithms; Industrial electronics; Kernel; fault detection; genetic algorithm; kernel parameters; rotating machines; support vector data description;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Electronics and Applications, 2007. ICIEA 2007. 2nd IEEE Conference on
  • Conference_Location
    Harbin
  • Print_ISBN
    978-1-4244-0737-8
  • Electronic_ISBN
    978-1-4244-0737-8
  • Type

    conf

  • DOI
    10.1109/ICIEA.2007.4318518
  • Filename
    4318518