DocumentCode
3443499
Title
Notice of Retraction
Measurement of ESD protection structure irradiation degradation using TLP method
Author
Qian Shi ; Qing-Zhong Xiao ; Yuan Liu ; Yun-fei En
Author_Institution
Sci. & Technol. on Reliability Phys. & Applic. of Electron. Component Lab., China Electron. Produce Reliability, Guangzhou, China
fYear
2013
fDate
15-18 July 2013
Firstpage
2029
Lastpage
2030
Abstract
Notice of Retraction
After careful and considered review of the content of this paper by a duly constituted expert committee, this paper has been found to be in violation of IEEE´s Publication Principles.
We hereby retract the content of this paper. Reasonable effort should be made to remove all past references to this paper.
The presenting author of this paper has the option to appeal this decision by contacting TPII@ieee.org.
Ionization radiation causes ESD protection structure of integrated circuit degradation. A new method using Transmission Line Pulse (TLP) test is introduced in this article; this method gives more detailed information of the ESD protection structure´s degradation. Turn-on voltage, hold voltage, turn-on resistance of two type ESD protection structures are measured before and after TID radiation test, results are discussed.
After careful and considered review of the content of this paper by a duly constituted expert committee, this paper has been found to be in violation of IEEE´s Publication Principles.
We hereby retract the content of this paper. Reasonable effort should be made to remove all past references to this paper.
The presenting author of this paper has the option to appeal this decision by contacting TPII@ieee.org.
Ionization radiation causes ESD protection structure of integrated circuit degradation. A new method using Transmission Line Pulse (TLP) test is introduced in this article; this method gives more detailed information of the ESD protection structure´s degradation. Turn-on voltage, hold voltage, turn-on resistance of two type ESD protection structures are measured before and after TID radiation test, results are discussed.
Keywords
electrostatic discharge; integrated circuit reliability; integrated circuit testing; ionisation; transmission lines; ESD protection structure irradiation degradation; TID radiation test; TLP method; hold voltage; integrated circuit degradation; ionization radiation; transmission line pulse test; turn-on resistance; turn-on voltage; Degradation; Electrostatic discharges; Integrated circuits; Leakage currents; Power transmission lines; Transmission line measurements; Voltage measurement; ESD; total dose radiation; transmission line pulse;
fLanguage
English
Publisher
ieee
Conference_Titel
Quality, Reliability, Risk, Maintenance, and Safety Engineering (QR2MSE), 2013 International Conference on
Conference_Location
Chengdu
Print_ISBN
978-1-4799-1014-4
Type
conf
DOI
10.1109/QR2MSE.2013.6625980
Filename
6625980
Link To Document