• DocumentCode
    3443673
  • Title

    Modeling, synthesis, and characterization of thin film Copper Oxide for solar cells

  • Author

    Darvish, Davis S. ; Atwater, Harry A.

  • Author_Institution
    California Inst. of Technol., Pasadena, CA, USA
  • fYear
    2009
  • fDate
    7-12 June 2009
  • Abstract
    The modeling, growth, and characterization of Copper Oxide thin films for solar cell applications are reported. Cu2O has several attractive properties which include its direct band gap (Eg = 2.17 eV) for use in photo-electrolysis of water and use in tandem multi-junction cells. Detailed balance calculations predict efficiencies on the order of 20% while Cu2O cells have yet to even pass 2% efficiency. The device physics model reveals that defects, particularly at the heterojunction interface, are the main reason for lowered efficiencies. Epitaxial Cu2O (100) thin films on MgO are fabricated using RF Oxygen plasma MBE. The films are quite smooth and showed mobilites in the range of 10-100 cm2/V*sec and carrier concentrations in the range of 1014-1017. Finally, the epitaxial growth of Cu2O on a MgO template is demonstrated.
  • Keywords
    carrier density; copper compounds; energy gap; epitaxial layers; molecular beam epitaxial growth; solar cells; Cu2O; RF oxygen plasma MBE; carrier concentrations; direct band gap; electron volt energy 2.17 eV; epitaxial Cu2O(100) thin films; epitaxial growth; heterojunction interface; multijunction cells; photoelectrolysis; solar cells; thin film copper oxide; water; Copper; Heterojunctions; Oxygen; Photonic band gap; Photovoltaic cells; Physics; Radio frequency; Semiconductor process modeling; Transistors; Water;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference (PVSC), 2009 34th IEEE
  • Conference_Location
    Philadelphia, PA
  • ISSN
    0160-8371
  • Print_ISBN
    978-1-4244-2949-3
  • Electronic_ISBN
    0160-8371
  • Type

    conf

  • DOI
    10.1109/PVSC.2009.5411394
  • Filename
    5411394