• DocumentCode
    3445417
  • Title

    Experimental validation of high-speed fault-tolerant systems using physical fault injection

  • Author

    Martínez, R.J. ; Gil, P.J. ; Martín, G. ; Pérez, C. ; Serrano, J.J.

  • Author_Institution
    Inst. de Robotica, Valencia Univ., Spain
  • fYear
    1999
  • fDate
    36465
  • Firstpage
    249
  • Lastpage
    265
  • Abstract
    The paper introduces a methodology for validation of dependable systems based on physical fault injection. The approach defines the elements of the injection environment and the requirements that are necessary to control the injection process with fine granularity, allowing for the elimination of glitches and non valid experiments, therefore making the validation process more accurate. We also show the main features of a high-speed pin level fault injection tool, AFIT (Advanced Fault Injection Tool), that incorporates most of the requirements necessary for the application of this methodology. As a practical case study, we have validated FASST, a fault tolerant multiprocessor system composed of several fail-silent processor modules. The dependability of the system is shown, including the influence of the error detection levels in the coverage and latency of the error
  • Keywords
    error detection; fault tolerant computing; formal verification; multiprocessing systems; AFIT; Advanced Fault Injection Tool; FASST; dependability; dependable systems; error detection levels; error latency; experimental validation; fail-silent processor modules; fault tolerant multiprocessor system; fine granularity; high-speed fault-tolerant systems; high-speed pin level fault injection tool; injection process control; physical fault injection; validation process; Circuit faults; Contracts; Delay; Electromagnetic interference; Electromagnetic measurements; Fault tolerant systems; Gas insulated transmission lines; Process control; Prototypes; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Dependable Computing for Critical Applications 7, 1999
  • Conference_Location
    San Jose, CA
  • Print_ISBN
    0-7695-0284-9
  • Type

    conf

  • DOI
    10.1109/DCFTS.1999.814299
  • Filename
    814299