A comparative study on wheat leaf area index by different measurement methods

Leaf area index (LAI) is an important parameter on the crop yield estimation and pests and diseases identification. LAI is a good indicator for crop growth and energy exchange information. At present, there are many ways to measure the crop LAI, but there are quite few studies or testing to compare the applicability among the different methods on the LAI inversion. In this study, some common methods, like hyper-spectral inversion model, digital image method had been adopted for wheat LAI measurement. According to the analysis of the data which had been collected from the different growth periods of wheat, this paper had compared the accuracy and concluded the applicability of the different LAI measurement methods. This article aims to provide some guidance on the method selection for leaf area index estimation of wheat.